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MDC CSM/Win-4980AL2470 CV/IV测量系统

MDC的CSM/WIN系统是最理想的仪器,以充分利用您的汞探针测量。CSM/WIN系统包含广泛的软件,用于对半导体和MOS器件进行各种测试。此外,专用的汞探针软件还有助于汞探针的校准。对杂散电容和接触面积的自动测定采用计算机控制。MDC CSM/WIN系统具有多种电压范围和电容测量能力。执行单频、多频和准静态测量的系统是可用的。MDC还为您的其他测量需求提供了最完整的单一和多个热卡盘系统的选择。

技术参数

CSM/Win-4980AL2470 C-V/I-V Measurement System半导体CV/IV测量系统
Advanced Semiconductor Measurement System,P/N: CSM/Win-4980AL


Hardware:

Complete with Keysight (Agilent) Model E4980ALPrecisionLCR Meter with no internal bias.

Frequency range is 20 Hz to 1 MHz.

Integrated Pentium computer, one hard disk drive, keyboard, mouse


Windows 11 operating system
CSM/Win C-V measurement software including C-V plotting, N-W profiling, MOS and PN junction measurement programs, and HEMT analysis program.
I-V programs
Variable frequency measurement programs.
On-line Help utility and Setup utility


Multiplexer with Extended Bias Voltage Option,
1,000V, P/N: KPS-1K-2470-9611
Additional hardware to supply external bias voltage for Agilent 4980AL. Allows IV and CV measurements at biases
up to 1,000 Volts.
Includes Keithley 2470 SMU, Model 9611-1000
External Bias Filter.
 Voltage Range: ±1000 V, 100 mV resolution
 Current Range: ±20 mA , 10 fA resolution


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