中文/English

2.1 Chemical Cleaning Workbench/Electroplate Station

America Kinectics\Wafab International

Main characteristic index∶

Materials∶

Polypropylene or stainless steel(304);

Options quartz groove;

Microcomputer temperature controller∶

In groove temperature variation <±1.0℃(@50℃);

Outside groove circulating heating system∶

Reliable and easy maintenance;

Overheating and water level alarm, water can be added automatically to maintain the water level;

(electroplating) hanging plating bath,4- point cathode contact;DC/pulse power supply;

Options PLC Touch-screen control;

Magatherm石英槽

Magatherm石英槽

过滤系统

循环加热系统

2.2 Precision Diamond Manual Scriber

America Dynatex International

Parameters

GST-100

GST-150

wafer size Max 100mm Max 150mm
wafer thickness 40-1725μm(associated with the materials)
scratch width <5μm
minimum step distance standard 5μm (options 2μm)
scribing speed max 100mm/sec
collapse piece speed 2-4 breaks/sec
collapse piece means back side rapid air rush rod (British patent)
graphic recognition vision system auto-registration,pattern recognition,automatic delineation, automatic step and calibrate step error according to the set
materials GaAs,inP,GaP.Silicon,Saphire,Quartz
user controllable parameters cutting angle, drag force, scribing speed, entry speed of knife, collapse piece force, any few number core size

 

 

2.3 Wafer Expander

America Dynatex International

product characteristics:
size: wafer size 6" or smaller, 5", 6" or 7" hoop group
rapid: rapid periodic time fix the tape to hoop group and expand
precision: suitable for picking and laying equipment
best expansion: constant temperature control and fully adjustable heating platform optimization expansion
clean: no physical contact between the chip and the controller
technical index:
max Hoop group size: 7"
maximum chip size: 6"
temperature range: 100-450C℃ or 40-230℃

2.4 Ball/Wedge Wire Bonding

Germany Technical Product Trade (TPT)

HB30

HB05

HB16

  Manual machine Semi-automatic--1 Semi-automatic--2 Semi-automatic heavy duty aluminum wire
wedge bonding HB02 HB06 HB12 HB30
ball bonding HB04 HBO8 HB14 no
wedge bonding + ball bonding HB05 HB10 HB16 no

parameters Manual machine Semi-automatic--1 Semi-automatic--2 Semi-automatic heavy duty aluminum wire
wedge bonding 17-75um 100-500um
tape bonding 25*250um no
ball bonding and jump pier bonding 17-50um no
multipoint bonding no yes
direction control XYZ manual Z automatic Z and Y automatic
parameter setting interface 4.1 inches LCD,hand wheel adjustment 6.5 inches touch screen
automatic height no yes
radian control no highly controlled highly and radian controlled
bondarm length 165mm
deep mobile 19mm
programs stored 20 100
wire feed rolls 2 inches hand-operated 2 inches electrodynamic 4 inches hand-operated
fine mobile range 10*10mm 15*15mm
handle and head movement rate 6:1 6:1 (options 3:1)
ultrasonic frequency 62khz
ultrasonic frequency (max) 5w 50w
solder and sample contacting time 20-1000ms 15-2000ms 0-10s
welding force (unit: 1% cN) 15-130 15-150 50-1800
built-in heating stage 250℃(max) no
illuminating system double LED fiber-optics guided double halogen lamp fiber-optics guided
chips Pick & Place options no
built-in tension tester no options no
copper wire welding options no
laser positioning options
power requirements 100-240V/10A
weight 29kg 42kg 50kg
remarks HB05=(wedge)+HB04(ball) HB10=HB06(wedge)+HB08(ball) HB10=HB12(wedge)+HB14(ball)  

AS-Micro

AS-One

AS-Master

Characteristic AS-Micro AS-One 100 AS-One 150 AS-Master
max substrate dia 75mm 100mm 150mm 200mm
chamber size 85dia×25mm 130dia×25mm 200dia×25mm 300dia×25mm
temperature range RT-1250℃ RT-1500℃ RT-1300℃ RT-1500℃
heating rate 0.1-250℃ 0.1-200℃ 0.1-150℃ 0.1-200℃
temperature control rapid digital PID rapid digital PID rapid digital PID rapid digital PID
process gas line 3 5 5 6
AS-Micro main technology parameters
  • max dia 3 inches (2 inches sample can choose 3inches substrate)
  • temperature range: room temperature to 1250°C (± 1°C)
  • heating rate: max 250°C/s (2inches Si wafer can reach 300°C/s)
  • process gas line: max 4, using MFC controller
  • vacuum range: 10-3 Torr (Roughing), 10-6 Torr (Turbo)

AS-Micro/more~

Technology parameters AS-One 100 AS-One 150
sample size 100 mm(") 150 mm(")
vacuum chamber size 130 mm diameter x 25 mm 200 mm diameter x 25 mm
lamps numbers/max power 12 / 30 kW 18 / 34 kW
max heating temperature (high temperature options) 1250C (1500C) 1200C (1300C)
heating rate 0.1C to 200C/s 0.1C to 150C/s
cooling mode air cooling
thermocouple 2 K type(one center and one edge)
cryometer range 150C to 1100C
pyrometer range 400C to 1500C
infrared pyrometer 2 (one center and one edge)
process gas line max 5
vacuum range 10E-3 Torr (Roughing) 10E-6 Torr (Turbo)

AS-One/more~

Parameters S20 S20 HT 2000 2000HT
max temperature 1150°C 1500°C 1250°C 1500°C
heating zone 6 6 10 10
max power 75 kW 105 kW 90 kW 105 kW
max sample size 200mm dia or 200mmx200mm rectangle
vacuum chamber water-cooling, stainless steel chamber wall, low noise
heating infrared partition heating, air cooled the lamp tube
temperature control thermocouple and pyrometer control with PID
vacuum range 10E-3 Torr (Roughing), 10E-6 Torr (Turbo)
process gas line max 6
control method computer control, provide more than 100 processing procedures with different requirements

AS-Master/more~

Applications RTA, RTO, Reflow, Implantation annealing…
Substrate size up to 6-inch diameter samples
Temperature max 1300°C (depending on furnace version)
Temperature ramp rate 150°C/s on 4-inch silicon wafer (depending on version)
Temperature control multi-zone, thermocouple or pyrometer, fast PID
Vacuum capability 10-3 Torr (10-6 Torr option)
Gas lines up to 6 gas lines with MFC and one purge line with needle valve
Loading manual, optional cassette to cassette or load-lock

As-Premium/more

Applications Silicon Carbide implantation annealing, Graphene on SiC…
Substrate size up to 4-inch diameter samples
Temperature max 2000°C up to one hour
Temperature ramp rate 4°C/s up to 1800°C and 2°C/s up to 2000°C
Temperature control thermocouple and pyrometer, fast PID
Vacuum capability 10-6 Torr
Gas lines up to 8 gas lines with MFC and one purge line with needle valve
Loading manual

Zenith/more

2.6 CMP System

Revasum

Table Motor Size/Cntrl 5 Hp w/ AC Var.SpeedDrv
Table Diameter 22” [~560mm]
Oscillation Stroke Adjustable
Slurry System(s) 2 Std/ 3rd optional
Slurry In/Out ~3 GPH
Dimensions (SAE) 48”W x 51”D x 72”H
Dimensions (Metric) 1.2M x 1.3M x 1.8M
Footprint ~17 Ft² [~1.57 M²]
Weight ~1800 lbs [~820 K]
Wafer Capacity 100mm to 200mm
Control System PC-DOS 2000
Wafer Handling Manual Wafer Load
Configuration 1 tables, 1 polish head

2.7 P8010 Advanced Linear Track System

America C&D Semiconductor Services Inc.

P8010 Technical Data
Available modules Coater, developer, hot plates, chill plates, vapor prime
Transfer Method Automatic transfer arm with improved design maintaining end-point placement to within ± 0.1 mm over 300,000 wafers
User Interface Windows-based operating system with smartPro GUI
Transfer Mode Serial transport
Indexer SEMI standard H confguration
Coater Spin motor: 50 RPM-9500 RPM in 10 RPM increments (Optional brushless motor with digital controller)
# of Dispenses: Up to four
Solvent nozzles: Top and bottom EBR
Developer Spin motor: 50 RPM – 9500 RPM in 10 RPM increments (Optional brushless motor with digital controller)
Stream and spray nozzles
Hot Plate Hot plate temperature: Up to 300˚C (optional temperature to 400˚C)
Uniformity: ±0.5% (50˚C -300˚C)
Bake method: Contact or fxed/programmable proximity options
Chill plate Standard house chilled water
Optional high efciency chiller at ambient ± .1˚C – Option
Vapor Prime Temperature range25˚C to 190˚C
Method: Programmable and/or fxed proximity bake capability

2.8 P8060 Copper Bump Developer

America C&D Semiconductor Services Inc.

P8060 Technical Data
Available modules Copper bump developer
Wafer size 50 mm - 200 mm wafers
Transfer Method Automatic transfer arm with improved design maintaining end-point placement to within ± 0.1 mm over 300,000 wafers
Transfer Mode Serial transport
User Interface Windows-based operating system with smartPro GUI

2.9 P8000 Track System

America C&D Semiconductor Services Inc.

P8000 Technical Data
Available modules Coater, developer, hot plates, chill plates, vapor prime
Wafer Size 88X 50 mm - 200 mm
86X 50 mm - 150 mm
Transfer Method 88X - Automatic transfer arm
86X - Belt transfer
User Interface Card cage control (with optional Recipe Master for 88X)
Transfer Mode Serial transport
Indexer SEMI standard H confguration
Coater Spin motor: 50 RPM – 9500 RPM in 10 RPM increments
(Optional brushless motor with digital controller)
# of Dispenses: Up to four
Solvent nozzles: Top and bottom EBR
Developer Spin motor: 50 RPM – 9500 RPM in 10 RPM increments
(Optional brushless motor with digital controller)
Stream and spray nozzles
Hot Plate Hot plate temperature: Up to 300˚C
(Optional temperature to 400˚C)
Uniformity: ±0.5% (50˚C -300˚C)
Bake method: Contact or fxed/programmable proximity
Chill plate Standard house chilled water
Optional high efciency chiller at ambient ± .1˚C – Option
Vapor Prime Temperature range25˚C to 190˚C
Method: Programmable and/or fxed proximity bake capability

2.10 P9000 Cluster System

America C&D Semiconductor Services Inc.

P9000 Technical Data
Feature Sizes ≥ .35μ
Resist dependent and assumes temperature/humidity
control within fab of ±1.0ºC and ± 3% relative humidity.
User Interface Windows-based operating system with smartPro GUI
MTBF ≥ 500 hrs, or 12,000 wafers (Based on C&D’s PM schedule)
MTTR ≤ 1 hour
Uptime 95% or better
Wafers Broken 1 in 10,000 wafers
Reliability 95% uptime in volume process manufacturing
System throughput 100+ wafers per hour (Configuration & Process Dependent)

2.11 P7000 Efficient Alloying Furnace

America C&D Semiconductor Services Inc.

Model SmartPro P7000
wafer size 2-8inches
temperature up to 500°C
speed 20piece/h
major advantage reliable, simple and efficient, realized the chip box (C to C) function
infinitely close heating mode,heating plate non-touch the back of wafer, low warping, high uniformity and high repeatability
multiple gas, controlled environment and slow cooling
by varying the distance between the wafer and the heating plate to control the heating rate
manual and automatic control, efficient, twice as efficient as RTA
higher cost performance
Model MC050 MC100 MC200
wafer size 2 inches 4 inches 8 inches
applications

semiconductor: SiO2, HfO2, Ta2O5, Cu, TiN, TaN, ...
high k dielectric: SrTiO3, BaTiO3,Ba(1-x)SrxTiO3(BST) ferroelectrics: SBT, SBTN,PLZT, PZT...
superconductor: YBCO, Bi-2223, Bi-2212, Tl-1223, …
piezoelectric: (Pb, Sr)(Zr,Ti)O3, modified lead titanate
metal: Pt, Cu, ...
super magnetoresistance
thermal coating
buffer layer
metal layer, optics, etc.

temperature up to 1200°C up to 850°C up to 850°C
vacuum barometric pressure——10E-3 Torr
evaporator up to 6 up to 4 up to 4
gas circuit Up to 6,MFC control
process chamber quartz tube (water-cooled stainless steel flange) controllable temperature stainless steel wall, rotating sample seat controllable temperature stainless steel wall, rotating sample seat
heat halogen lamp resistance wire resistance wire
temperature control fully digitized PID control
Model SprayCVD 050 (also used for annealing)
wafer size 2*2 inches
applications

implantation annealing
compound semiconductor annealing
crystallization and densification
solar cell: SnO2, ZnO, TiO2, In2O3 …
photoelectric coating: NiO, Co3O4 …
ferroelectric memory: SrTiO3 …
insulating barrier: MgO …
catalytic active coating: Co3O4, NiCo2O4 …
semiconductor: Nb2O5 …
superconductor: YBCO …
electrochromic coating: WO3 …
solid oxide fuel cell (SOFC): ZrO2, YSZ, GCO …

temperature room temperature——1200°C
vacuum barometric pressure——10E-3 Torr
gas circuit up to 3, MFC control
process chamber quartz tube (water-cooled stainless steel flange)
heat halogen lamp (upper and lower heating modes are available)
temperature control fully digitized PID control
Model Benchark 800
characteristic 1—8 inches
up to 6 process gases, MFC control
equipped with a water-cooled electrode for ion etching
hot bottom electrode plate and water-cooled electrode plate,used to enhance PECVD
etch (SiO2&Si3N4):100°C/1500 2000Amin/ Uniformity +/-5%
enhanced plasma CVD(PECVD)(SiO2&Si3N4):300°C/500Amin/ uniformity +/-5%
Model PlasmaStar
characteristic 12 inches * 14 inches plasma region
up to 4 process gases, MFC control
parallel electrodes, upper electrode with a spray head,lower electrode with the function of water cooling
optional cage electrode
Model PlasmaStar
characteristic 12 inches * 14 inches Plasma region
up to 4 process gases, MFC control
parallel electrodes, upper electrode with a spray head,lower electrode with the function of water cooling
optional cage electrode